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Nonlinearity in the Detector used in HDS
The nonlinearity of the EEV 42-80 CCDs used in HDS has been
investigated by Tajitsu et
al. 2010.
While good linearity is confirmed in the data recorded for
electron numbers less than 10,000e-(~6,000ADU), significant
nonlinearity appears for higher electron numbers.
The nonlinearity effect is of the order of several percent at 50,000e-.
No clear pixel-to-pixel difference is observed in the nonlinearity
effect in a given chip; however, thereis a notable difference in the
nonlinearity effxt between two CCD chips used in the instrument.
No siginificant time variation in the nonlinearity effect is
found from our measurement up to now (June 2010).
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